RED-Wave 红外InGaAs 光纤光谱仪,光谱范围900-2300nm,TEC制冷到-10°C,信噪比可以做到4000:1。积分时间1ms到30s。该红外InGaAs 光纤光谱仪的*高分辩率可以达到3.1nm。
Specifications Zero defect 512 detector RED-Wave NIR InGaAs Spectrometer | |
动态范围: 4000:1 with 5 decades | 尺寸: 150 x 100 x 68.8 mm |
分辨率: 见下表( 25μm slit) | 功率: 2 Amps @ 5 VDC |
像素尺寸: 25um x 500um | A/D转化: 16-bit |
像素阱深: 130 x108 electrons | 数据转换速度: 40x faster than USB-1 |
阱深控制: 130 x108 or 5 x106 el. | 积分时间: 1ms to 30s |
信噪比: 4000:1 with TEC cooling(900-1700nm)
400:1 with 2x TEC cooling(900-2300nm)
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狭缝选择: 25, 50,100, or 200μm |
软件: SpectraWiz program & apps |
RED-Wave Models | Number of Elements | Spectrometer Range (nm) | Grating (g/mm) | Grating Range (nm) | Dispersion (nm/pixel) | Estimated Resolving Resolution |
NIR | 512 | 900-1700 | 250 | 800nm | 1.562 | 3.1nm |
NIRb | 512 | 900-1600 | 300 | 650nm | 1.269 | 2.5nm |
NIR2 | 512 | 1250-1575 | 600 | 325nm | 0.634 | 1.3nm |
NIR2b | 512 | 1150-1475 | 600 | 325nm | 0.634 | 1.3nm |
NIR | 1024 | 1000-1700 | 600 | 700nm | 0.683 | 1.4nm |
NIR3-HR | 512 | 1530-1605 | 1200 | 70nm | 0.195 | 0.4nm |
NIR3-HR | 1024 | 1500-1640 | 1200 | 140nm | 0.195 | 0.4nm |
NIRX | 512 | 1500-2200 | 300 | 700nm | 1.367 | 2.8nm |
NIRX | 1024 | 1500-2200 | 600 | 700nm | 0.683 | 1.4nm |
NIRX-SR | 512 | 900-2300 | 300 | 1400nm | 5.3 | <13nm |
NIRX-SR | 1024 | 900-2300 | 600 | 1400nm | 2.7 | <7nm |
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